Document Type

Article

Publication Date

1995

DOI

10.1103/PhysRevB.52.1481

Publication Title

Physical Review B

Volume

52

Issue

3

Pages

1481-1484

Abstract

Scanning-tunneling microscopy has been used to study temperature and coverage dependence of the structure of lead on the Si(111)-7×7 surface. For low Pb coverage, the Pb atoms favored the faulted sites. The ratio between the number of Pb atoms on faulted to unfaulted sites increased after sample annealing. An energy difference of 0.05 eV associated with a Pb atom on these two sites is estimated. The mobility of Pb atoms on Si(111) was observed at a temperature as low as 260°C for a coverage of 0.1 and 1 ML. © 1995 The American Physical Society.

Original Publication Citation

Tang, D., Elsayed-Ali, H. E., Wendelken, J., & Xu, J. (1995). Scanning-tunneling-microscopy study of Pb on Si(111). Physical Review B, 52(3), 1481-1484. doi:10.1103/PhysRevB.52.1481