Development of a Simulation Tool to Study Secondary Electron Emission in Copper Coated with Graphene

Document Type

Presentation

Publication Date

2024

Publication Title

Research Experiences for Undergraduates in Computational Methods with Applications in Materials Science

Conference Name

Mississippi State University Undergraduate Research Showcase 2024, 8-2-2024, Mississippi State, Mississippi

Abstract

Secondary electron emission (SEE) arises from the interaction of high-energy particles with metallic surface materials. The emission of electrons from copper surfaces can be problematic in a variety of applications, such as particle accelerators or microchips operating in spacecraft. Emitted electrons can build up in accelerator walls, reducing the accuracy of the experiment. SEE in microchips can flip logical bits, create unwanted heat, and reduce the device's lifespan. In recent years, graphene has been proposed as a potential moderator to prevent or mitigate these effects. Graphene can be applied in layers on top of a copper substrate to reduce the secondary electron yield (SEY): the ratio of emitted secondary electrons to total incident electrons. The focus of this investigation has been to simulate the SEE process in copper and to obtain its SEY at various energies of incident primary electrons. Monte Carlo methods, such as the continuous-slowing-down approximation and numerical integration schemes, have been used to generate and track secondary electrons within the copper. The simulation generates secondary electrons from primary electron interactions consistent with existing material models. The positions and energy losses of the secondary electrons are updated using Mott's cross-section formula and the stopping power, respectively. Electrons’ paths are then propagated until their energy falls below a prescribed threshold or the electron is emitted from the surface. Simulations have successfully reproduced SEY results for copper with and without graphene surface layers for an incident electron energy range of 60 eV to 1000 eV. The results show that the SEY of the copper with graphene layers is reduced by 20% compared to the SEY of pure copper.

Comments

A Conference Poster Presentation.

Original Publication Citation

Vassilakopoulos, George and Collins, Eric, "Development of a Simulation Tool to Study Secondary Electron Emission in Copper Coated with Graphene" (2024). Research Experiences for Undergraduates in Computational Methods with Applications in Materials Science. 2.
https://scholarsjunction.msstate.edu/ccs-reu/2

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