New Diamond and Frontier Carbon Technology
Diamond thin films grown by the microwave plasma enhances chemical vapor deposition (CVD) process have been investigated as an internal reference in fiber optic remote Raman sensing. The growth parameters have been optimized for diamond thin films on quarts substrates using a gas mixture of methane, carbon dioxide, and hydrogen. The resulting films exhibit essentially no Raman spectral background while exhibiting a strong Raman peak at 1332 cm-¹. The films are used as an internal reference in the quantitative measurement of chemical concentration using remote fiber optic Raman sensing. Internal referencing is accomplished by normalizing all spectral intensities of the chemical species to the integrated area of the CVD diamond reference peak at 1332 cm-¹ and verified using ethanol/water solutions. It is shown that the measurement is independent of laser power fluctuations.
Original Publication Citation
Albin, S., Zheng, J., Xiao, B., Cooper, J. B., Jeffers, R. B., & Antony, S. (2003). Chemical vapor deposited diamond films for self-referencing fiber optic Raman probes. New Diamond and Frontier Carbon Technology, 13(6), 341-351.
Albin, Sacharia; Zheng, Jianli; Xiao, Bing; Cooper, John B.; Jeffers, Robert B.; and Antony, Sonia, "Chemical Vapor Deposited Diamond Films for Self-Referencing Fiber Optic Raman Probes" (2003). Chemistry & Biochemistry Faculty Publications. 168.