Part of the Engineering Commons

Works by D.J. Olego in Engineering

1988

Raman Scattering Characterization of the Microscopic Structure of Semi-Insulating Polycrystalline Si Thin Films, D.J. Olego, H. Baumgart
Electrical & Computer Engineering Faculty Publications

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Strains in Si-onSiO2 Structures Formed By Oxygen Implantation: Raman Scattering Characterization, D.J. Olego, H. Baumgart, G.K. Celler
Electrical & Computer Engineering Faculty Publications

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