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Simulation Study of HEMT Structures With HfO2 Cap Layer For Mitigating Inverse Piezoelectric Effect Related Device Failures, Deepthi Nagulapally, Ravi P. Joshi, Aswini Pradhan Electrical & Computer Engineering Faculty Publications
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Evaluation of Degradation in GaN High Electron Mobility Transistors Due to the Inverse Piezoelectric Effect, Deepthi Nagulapally Electrical & Computer Engineering Theses & Dissertations
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