Part of the Engineering Commons

Works by V. Ranjan in Engineering

2012

Growth Analysis of (Ag,Cu)InSe2 Thin Films Via Real Time Spectroscopic Ellipsometry, S. A. Little, V. Ranjan, R. W. Collins, S. Marsillac
Electrical & Computer Engineering Faculty Publications

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2009

Electronic and Structural Properties of Molybdenum Thin Films as Determined by Real Time Spectroscopic Ellipsometry, J. D. Walker, H. Khatri, V. Ranjan, Jian Li, R. W. Collins, S. Marsillac
Electrical & Computer Engineering Faculty Publications

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