Document Type
Article
Publication Date
1991
DOI
10.1063/1.347760
Publication Title
Journal of Applied Physics
Volume
69
Issue
1
Pages
257-260
Abstract
The strain patterns detected by x-ray topography in wafers bonded for silicon-on-insulator (SOI) technology were found related to the flatness nonuniformity of the original wafers. Local stresses due to the bonding process are estimated to be about 1×108 dynes/cm2. The stress is reduced about 100 times for the thin (0.5 μm) SOI films. Most of the wafer deformation occurs during room temperature mating of the wafers. The deformation is purely elastic even at 1200 °C. The magnitude of the stress appears insignificant for complimentary metal-oxide-semiconductor devices performance.
Original Publication Citation
Maszara, W. P., Jiang, B. L., Yamada, A., Rozgonyi, G. A., Baumgart, H., & De Kock, A. J. R. (1991). Role of surface morphology in wafer bonding. Journal of Applied Physics, 69(1), 257-260. doi:10.1063/1.347760
Repository Citation
Maszara, W.P.; Jiang, B.L.; Yamada, A.; Rozgonyi, G.A.; Baumgart, H.; and de Kock, A.J.R., "Role of Surface Morphology in Wafer Bonding" (1991). Electrical & Computer Engineering Faculty Publications. 241.
https://digitalcommons.odu.edu/ece_fac_pubs/241
Comments
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Journal of Applied Physics Volume 69, Issue 1, Pages 257-260, and may be found at https://doi.org/10.1063/1.347760.