Journal of Applied Physics
Model studies of current conduction and breakdown in TiO2 were carried out. Our simulation results indicate that electrical breakdown of TiO2 under multiple-pulsed conditions can occur at lower voltages as compared to quasi-dc biasing. This is in agreement with recent experimental data and is indicative of a cumulative phenomena. We demonstrate that the lower breakdown voltages observed in TiO2 under pulsed conditions is a direct rise-time effect, coupled with successive detrapping at the grain boundaries. 2007 American Institute of Physics.
Original Publication Citation
Zhao, G., Joshi, R. P., Lakdawala, V. K., Schamiloglu, E., & Hjalmarson, H. (2007). TiO2 breakdown under pulsed conditions. Journal of Applied Physics, 101(2), 026110. doi:10.1063/1.2425001
Zhao, G.; Joshi, R. P.; Lakdawala, V. K.; Schamiloglu, E.; and Hjalmarson, H., "TiO2 Breakdown Under Pulsed Conditions" (2007). Electrical & Computer Engineering Faculty Publications. 82.