Date of Award

Winter 1993

Document Type

Thesis

Degree Name

Master of Science (MS)

Department

Engineering Management

Committee Director

Derya A. Jacobs

Committee Member

Resit Unal

Committee Member

Billie Reed

Committee Member

Frederick Steier

Abstract

In electronic systems, it is interesting to understand exactly how the reliability is changing with time. Dynamic performance changes when a system passes from infant mortality stage into useful life phase and when the system passes from useful life phase into wearout phase. Dynamic performance also changes when the system is redesigned or when the system is acted on by a number of other outside forces such as a change in maintenance policy, escalation of alignment problems, or a change in training program. It is important to know when a system is changing dynamically in order to assess design, policy and program changes and to determine when changes in life cycle phase are occurring.

This study presents a methodology to analyze the reliability of electronic systems as they change in time dynamically. The method is developed mathematically and is proven with a simulation to be able to estimate system MTBF and to be able to determine when process changes occur. Three case studies of problem power supplies are provided to illustrate how the technique has been used to make cost avoidance decisions.

DOI

10.25777/m97w-zq31

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