Design, Simulation and Fabrication of Novel Diagnostic Device for Bunch Characterization and First Uncorrelated Emittance Measurement of Magnetized Electron Beam

Design, Simulation and Fabrication of Novel Diagnostic Device for Bunch Characterization and First Uncorrelated Emittance Measurement of Magnetized Electron Beam

College

Batten College of Engineering & Technology

Program

Ph.D. Engineering - Electrical & Computer Engineering

Publication Date

3-28-2019

Abstract

The study of magnetized electron beam has become a high priority for its use in ion beam cooling as part of Electron Ion Colliders and the potential of easily forming flat beams for various applications. A new diagnostic is described with the purpose of studying longitudinal and transverse magnetized beam properties. The device is a modification to the classic pepper-pot and was designed for use with a kicker cavity for longitudinal bunch profile measurements of magnetized beams. Used in this novel context this device is capable of measuring the uncorrelated components of transverse emittance in addition to the typical effective emittance.

Files

Design, Simulation and Fabrication of Novel Diagnostic Device for Bunch Characterization and First Uncorrelated Emittance Measurement of Magnetized Electron Beam


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