2006 ASEE Annual Conference Proceedings
2006 ASEE Annual Conference and Exposition, Chicago, Illinois, June 18-21
Two parallel sections of a sophomore level circuit analysis course in Electrical Engineering Technology were structured to provide insight to the marginal utility of out-of-class assignments versus in-class assessments in academic performance. Student distributions for each section, the classroom model, the composition of the common tests and exam, and grading formats are discussed. The data presented and the conditions of the resulting observations indicate the model which favored out-of-class assignments led to improved test scores.
Original Publication Citation
Flory, I., & Hearn, C. (2006). A comparison between frequent out-of-class assignments and frequent in-class assessments relative to student performance in a sophomore level electrical circuit analysis course. Paper presented at the 2006 ASEE Annual Conference and Exposition, Chicago, Illinois.
Flory, Isaac and Hearn, Christian, "A Comparison Between Frequent Out-Of-Class Assignments and Frequent In-Class Assessments Relative to Student Performance in a Sophomore Level Electrical Circuit Analysis Course" (2006). Engineering Technology Faculty Publications. 121.