Document Type
Article
Publication Date
2015
DOI
10.1103/PhysRevB.92.094502
Publication Title
Physical Review B
Volume
92
Issue
9
Pages
094502
Abstract
We investigated current induced depairing in the Bi₂Te₃/FeTe topological insulator-chalcogenide interface superconductor. The measured depairing current density provides information on the magnetic penetration depth and superfluid density, which in turn shed light on the nature of the normal state that underlies the interfacial superconductivity.
Rights
© 2015 American Physical Society. All rights reserved.
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Original Publication Citation
Kunchur, M. N., Dean, C. L., Moghadam, N. S., Knight, J. M., He, Q. L., Liu, H., Wang, J., Lortz, R., Sou, I. K., & Gurevich, A. (2015). Current-induced depairing in the Bi₂Te₃/FeTe interfacial superconductor. Physical Review B, 92(9), 094502. https://doi.org/10.1103/PhysRevB.92.094502
ORCID
0000-0003-0759-8941 (Gurevich)
Repository Citation
Kunchur, M. N.; Dean, C. L.; Shayesteh Moghadam, N.; Knight, J. M.; He, Q. L.; Liu, H.; Wang, J.; Lortz, R.; Sou, I. K.; and Gurevich, Alex, "Current-Induced Depairing in the Bi₂Te₃/FeTe Interfacial Superconductor" (2015). Physics Faculty Publications. 902.
https://digitalcommons.odu.edu/physics_fac_pubs/902