Document Type

Article

Publication Date

2003

Publication Title

Applied Physics Letters

Volume

83

Pages

21

DOI

10.1063/1.1626020

Abstract

We measured the dynamic I–V characteristics and vacuum ultraviolet (VUV) emission lines of the second continuum in xenon (170 nm) and argon (130.5 nm) from pulsed microhollow cathode discharges (MHCD). For pulse lengths between 1 and 100 μs the dynamic I–V characteristics are similar in both inert gases. Only the time variation of the VUV emission line at 170 nm for xenon can be related to the dimer excited states. In argon the energy transfer between the Ar*2 dimers and the oxygen impurity atoms is responsible for a qualitatively different time behavior of the resonance line at 130.5 nm. Consequently, the relative VUV efficiency reveals an inverse dependence on the electrical pulse lengths for the MHCD in xenon and argon, respectively.

Comments

This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Applied Physics Letters 83 (21) 4297-4299 and may be found at https://doi.org/10.1063/1.1626020.

Original Publication Citation

Petzenhauser, I., Biborosch, L. D., Ernst, U., Frank, K., & Schoenbach, K. H. (2003). Comparison between the ultraviolet emission from pulsed microhollow cathode discharges in xenon and argon. Applied Physics Letters, 83(21), 4297-4299. doi:10.1063/1.1626020

ORCID

0000-0001-7867-7773 (Schoenbach)

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