Document Type

Article

Publication Date

2005

Publication Title

Applied Physics Letters

Volume

86

Issue

7

Pages

071501

DOI

10.1063/1.1862781

Abstract

A fluid model has been developed and used to help clarify the physical mechanisms occurring in microhollow cathode discharges (MHCD). Calculated current-voltage (I-V) characteristics and gas temperatures in xenon at 100 Torr are presented. Consistent with previous experimental results in similar conditions, we find a voltage maximum in the I-V characteristic. We show that this structure reflects a transition between a low-current, abnormal discharge localized inside the cylindrical hollow cathode to a higher-current, normal glow discharge sustained by electron emission from the outer surface of the cathode. This transition, due to the geometry of the device, is a factor contributing to the well-known stability of MHCDs.

Comments

This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Applied Physics Letters, 86(7), 071501 and may be found at https://doi.org/10.1063/1.1862781.

Original Publication Citation

Boeuf, J. P., Pitchford, L. C., & Schoenbach, K. H. (2005). Predicted properties of microhollow cathode discharges in xenon. Applied Physics Letters, 86(7), 071501. doi:10.1063/1.1862781

ORCID

0000-0001-7867-7773 (Schoenbach)

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