Document Type

Article

Publication Date

1991

Publication Title

Journal of Applied Physics

Volume

69

Issue

5

Pages

2889-2895

DOI

10.1063/1.348598

Abstract

The phenomenon of electric field induced (EFI) emission is examined in several diatomic and polyatomic molecules. The possibility of using this phenomenon as a diagnostic tool to measure, nonintrusively, the strength and direction of local electric fields in plasmas is discussed. An estimate of the EFI signal emitted in a typical application plasma is given. This yields a lower bound on the detector sensitivity necessary to exploit EFI emission in practical applications. It is concluded that, at present, the EFI signal could be measured by some very sensitive infrared detection schemes available. Current progress in infrared detector technology, if maintained, could result in the possibility of utilizing EFI emission on a more routine basis. This would allow measurement of electric fields in plasmas of species that are not suitable candidates for any of the other currently available schemes which measure such fields.

Comments

This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in Journal of Applied Physics, 69 (5) 2889-2895 and may be found at https://doi.org/10.1063/1.348598.

Original Publication Citation

Dharamsi, A. N., & Schoenbach, K. H. (1991). Electric field induced emission as a diagnostic tool for measurement of local electric field strengths. Journal of Applied Physics, 69(5), 2889-2895. doi:10.1063/1.348598

ORCID

0000-0001-7867-7773 (Schoenbach, Karl)

Download

Share

COinS