Date of Award
Summer 1993
Document Type
Thesis
Degree Name
Master of Science (MS)
Department
Electrical & Computer Engineering
Program/Concentration
Electrical Engineering
Committee Director
Karl Schoenbach
Committee Member
Vishnu K. Lakdawala
Committee Member
Ravindra P. Joshi
Call Number for Print
Special Collections LD4331.E55K465
Abstract
A diagnostic technique has been developed which allows recording of the temporal and spatial development of electric field structures in GaAs photoconductive switches. The optical method is based on the Franz-Keldysh effect. Measurements were performed with a Nd:YAG activation laser and a GaAs laser diode as the probe laser. At low applied voltages a 100 atm wide region of high electric field is seen at the cathode only. With increasing voltage strong domain like structures emerge at the anode also. A calibration measurement shows that the electric fields in these domains are well above 50 kV/cm. At a threshold voltage, current filaments were recorded which cause a permanent current flow, the lock-on current, and at extreme levels permanent damage of the sample.
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DOI
10.25777/se8m-6x17
Recommended Citation
Kenney, John S..
"Absorption Imaging Studies on Intrinsic GaAs"
(1993). Master of Science (MS), Thesis, Electrical & Computer Engineering, Old Dominion University, DOI: 10.25777/se8m-6x17
https://digitalcommons.odu.edu/ece_etds/399
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