Date of Award
Spring 2006
Document Type
Thesis
Degree Name
Master of Science (MS)
Department
Electrical & Computer Engineering
Program/Concentration
Electrical Engineering
Committee Director
Oscar R. Gonzalez
Committee Member
W. Steven Gray
Committee Member
Michael Doviak
Call Number for Print
Special Collections LD4331.E55 L35 2006
Abstract
The operation of aircrafts depend heavily on closed-loop digital flight control systems which can be disrupted or upset by errant neutrons at aircraft flight altitudes. These upsets, called single-event upsets, range from data corruption to short circuits which can potentially cause physical damage to digital devices and unexpected behaviors in flight controls. Experiments conducted at the Los Alamos Neutron Science Center consisted of irradiating an experimental flight control computer (FCC) architecture with a high intensity neutron beam while the FCC controlled a simulation of a Boeing 737. It was postulated that the upset statistics on the FCC could be fitted with a Markov model. The main objective of this research was to analyze data from the single-event upset experiments and to determine if the rate of upsets could be modeled as a homogeneous Markov chain of a specific order. The analysis was based on well known X2 hypothesis test for determining independence, stationarity, and the order of a finite Markov chain of a sequence of data. The data analyzed is a sequence of states that indicates when the FCC was under an upset condition.
Rights
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DOI
10.25777/6hah-5e02
Recommended Citation
Lakdawaia, Anushka V..
"A Markovian Statistical Analysis of Single-Event Upsets on Closed-Loop Flight Control Systems"
(2006). Master of Science (MS), Thesis, Electrical & Computer Engineering, Old Dominion University, DOI: 10.25777/6hah-5e02
https://digitalcommons.odu.edu/ece_etds/403