Date of Award

Fall 2005

Document Type

Thesis

Degree Name

Master of Science (MS)

Department

Electrical & Computer Engineering

Program/Concentration

Electrical Engineering

Committee Director

Sacharia Albin

Committee Member

Vijayan K. Asari

Committee Member

Linda L. Vahala

Call Number for Print

Special Collections LD4331.E55 O36 2005

Abstract

Advances in terahertz radiation (T-rays) technology have great promise in various technological areas ranging from medical technology, imaging technology and accelerator technology. At Thomas Jefferson Laboratory, the Free Electron Laser division (FEL) produces very powerful beam of laser light by accelerating electrons in bunches along a beamline. This laser light absorbs and releases energy at various wavelengths. The new FEL upgrade led to the production of very bright terahertz (THz) radiation with an average power of 1 00watts which is about 100,000 times brighter than those produced elsewhere. These T-rays have very significant applications in the Laboratory. The most significant application is in FEL electron beam diagnostics. Analysis and signal processing of Terahertz radiation is one method of performing electron beam diagnostics. This process basically measures something proportional to the electron bunch length. These measurements are significant to the FEL because of the setbacks caused by the dependence of the FEL laser gain on the electron beam peak current and the slippage effect. Several analytical techniques for processing terahertz radiation have been reported, however in this work T-rays are processed using Labview 7 .1. The results obtained would be used in acquiring bunch length measurements at the FEL.

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DOI

10.25777/0x3z-jw82

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