Date of Award
Spring 1998
Document Type
Dissertation
Degree Name
Doctor of Philosophy (PhD)
Department
Electrical & Computer Engineering
Committee Director
Karl H. Schoenbach
Committee Member
Hani E. Elsayed-Ali
Committee Member
Gary E. Copeland
Committee Member
Ravindra P. Joshi
Abstract
Field emission of electrons is the major cause of electrical breakdown in high voltage systems in vacuum. The highest hold-off electric field of the carefully polished and cleaned stainless steel cathodes was increased to 70MV/m. Thin silicon monoxide, SiOx, cathode coatings reduced field emission and increased the hold-off field further. Coating the stainless steel cathodes with 2μ SiOx reduced the field emission current by at least two orders of magnitude at field of 50MV/m and increased the breakdown field to 140MV/m, doubling the breakdown voltage.
The increase in hold-off voltage with SiOx coatings is discussed in terms of electron transport within the coating. Measurements indicate that current in SiOx at high fields is controlled by Frenkel-Poole electron emission from deep centers located about 1eV below the conduction band. Field emission current is limited at the coating-vacuum interface due to an accumulation of filled electron traps.
Rights
In Copyright. URI: http://rightsstatements.org/vocab/InC/1.0/ This Item is protected by copyright and/or related rights. You are free to use this Item in any way that is permitted by the copyright and related rights legislation that applies to your use. For other uses you need to obtain permission from the rights-holder(s).
DOI
10.25777/fs7a-n845
ISBN
9780591815696
Recommended Citation
Allen, Raymond J..
"Field Emission and Breakdown Processes in Vacuum Gaps with SiO(X)-Coated Cathodes"
(1998). Doctor of Philosophy (PhD), Dissertation, Electrical & Computer Engineering, Old Dominion University, DOI: 10.25777/fs7a-n845
https://digitalcommons.odu.edu/ece_etds/49