Document Type
Article
Publication Date
2005
DOI
10.1063/1.1921338
Publication Title
Journal of Applied Physics
Volume
97
Issue
11
Pages
113304 (1-8)
Abstract
An electrical breakdown model for liquids in response to a submicrosecond(∼100ns) voltage pulse is presented, and quantitative evaluations carried out. It is proposed that breakdown is initiated by field emission at the interface of pre-existing microbubbles. Impact ionization within the microbubble gas then contributes to plasma development, with cathode injection having a delayed and secondary role. Continuous field emission at the streamer tip contributes to filament growth and propagation. This model can adequately explain almost all of the experimentally observed features, including dendritic structures and fluctuations in the prebreakdown current. Two-dimensional, time-dependent simulations have been carried out based on a continuum model for water, though the results are quite general. Monte Carlo simulations provide the relevant transport parameters for our model. Our quantitative predictions match the available data quite well, including the breakdown delay times and observed optical emission.
Original Publication Citation
Qian, J., Joshi, R. P., Kolb, J., Schoenbach, K. H., Dickens, J., Neuber, A., . . . Gaudet, J. (2005). Microbubble-based model analysis of liquid breakdown initiation by a submicrosecond pulse. Journal of Applied Physics, 97(11), 113304. doi:10.1063/1.1921338
Repository Citation
Qian, J.; Joshi, R. P.; Schoenbach, K. H.; Dickens, J.; Neuber, A.; Butcher, M.; Cevallos, M.; Krompholz, H.; Schamiloglu, E.; and Gaudet, J., "Microbubble-Based Model Analysis of Liquid Breakdown Initiation by a Submicrosecond Pulse" (2005). Electrical & Computer Engineering Faculty Publications. 203.
https://digitalcommons.odu.edu/ece_fac_pubs/203
ORCID
0000-0001-7867-7773 (Schoenbach)
Comments
This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. This article appeared in (Journal of Applied Physics, 97 (11) 113304 and may be found at http://dx.doi.org/10.1063/1.1921338.