TiO2 Breakdown Under Pulsed Conditions

Authors

G. Zhao, Old Dominion University
R. P. Joshi, Old Dominion University
V. K. Lakdawala, Old Dominion UniversityFollow
E. Schamiloglu
H. Hjalmarson

Document Type

Article

Publication Date

2007

DOI

10.1063/1.2425001

Publication Title

Journal of Applied Physics

Volume

101

Issue

2

Pages

026110 (1-3)

Abstract

Model studies of current conduction and breakdown in TiO₂ were carried out. Our simulation results indicate that electrical breakdown of TiO₂ under multiple-pulsed conditions can occur at lower voltages as compared to quasi-dc biasing. This is in agreement with recent experimental data and is indicative of a cumulative phenomena. We demonstrate that the lower breakdown voltages observed in TiO₂ under pulsed conditions is a direct rise-time effect, coupled with successive detrapping at the grain boundaries. 2007 American Institute of Physics.

Original Publication Citation

Zhao, G., Joshi, R. P., Lakdawala, V. K., Schamiloglu, E., & Hjalmarson, H. (2007). TiO₂ breakdown under pulsed conditions. Journal of Applied Physics, 101(2), 026110. doi:10.1063/1.2425001

Repository Citation

Zhao, G.; Joshi, R. P.; Lakdawala, V. K.; Schamiloglu, E.; and Hjalmarson, H., "TiO2 Breakdown Under Pulsed Conditions" (2007). Electrical & Computer Engineering Faculty Publications. 82.
https://digitalcommons.odu.edu/ece_fac_pubs/82