Document Type
Article
Publication Date
2011
DOI
10.1063/1.3652919
Publication Title
Applied Physics Letters
Volume
99
Issue
16
Pages
161905 (1-3)
Abstract
The lattice response of 5 nm thick bismuth film to femtosecond laser excitation is probed by ultrafast electron diffraction. The transient decay time after laser excitation is greater for diffraction from (012) lattice planes compared to (110) planes and is reduced for both planes with the increased laser fluence. These results indicate that different energy coupling mechanisms to the lattice occur depending on the crystal direction. The behavior of the diffraction peak width indicates partial disorder of the film upon photoexcitation that increases together with the laser fluence. © 2011 American Institute of Physics. [doi:10.1063/1.3652919]
Original Publication Citation
Esmail, A. R., & Elsayed-Ali, H. E. (2011). Anisotropic response of nanosized bismuth films upon femtosecond laser excitation monitored by ultrafast electron diffraction. Applied Physics Letters, 99(16), 161905. doi:10.1063/1.3652919
Repository Citation
Esmail, Ahmed R. and Elsayed-Ali, Hani E., "Anisotropic Response of Nanosized Bismuth Films Upon Femtosecond Laser Excitation Monitored by Ultrafast Electron Diffraction" (2011). Electrical & Computer Engineering Faculty Publications. 94.
https://digitalcommons.odu.edu/ece_fac_pubs/94