Document Type
Conference Paper
Publication Date
2021
DOI
10.18429/JACoW-IPAC2021-WEPAB104
Publication Title
Proceedings of the 12th International Particle Accelerator Conference
Pages
2840-2842
Conference Name
12th International Particle Accelerator Conference, 24th-28th May 2021, Campinas, Brazil
Abstract
The operating lifetime of GaAs-based photocathodes in DC high voltage electron photo-guns is dominated by the ionization rate of residual beamline gas molecules. In this work, experiments were performed to quantify the improvement in photocathode charge lifetime by biasing the photo-gun anode with a positive voltage, which repels ions generated downstream of the anode. The photo-cathode charge lifetime improved by almost a factor of two when the anode was biased compared to the usual grounded configuration. Simulations were performed using the particle tracking code General Particle Tracer (GPT) with a new custom element. The simulation results showed that both the number and energy of ions play a role in the pattern of QE degradation. The experiment results and conclusions supported by GPT simulations will be presented.
Rights
© 2021 JACoW.
Published under the terms of a Creative Commons Attribution 3.0 Unported (CC BY 3.0) License. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI.
Original Publication Citation
Yoskowitz, J., Krafft, G. A., Palacios-Serrano, G., Wijethunga, S., Grames, J., Hansknecht, J., Hernandez-Garcia, C., Poelker, M., Stutzman, M., Suleiman, R., & van der Geer, S. B. (2021). Improving the operational lifetime of the CEBAF photo-gun by anode biasing. In L. Liu, J. Byrd, R. Neuenschwander, R. Picoreti, & V. R. W. Schaa (Eds.), Proceedings of the 12th International Particle Accelerator Conference (pp. 2840-2842). JACoW Publishing. https://doi.org/10.18429/JACoW-IPAC2021-WEPAB104
ORCID
0000-0003-1792-6603 (Yoskowitz), 0000-0002-0328-5828 (Krafft), 0000-0002-5331-6127 (Palacios Serrano), 0000-0002-8765-9208 (Wijethunga)
Repository Citation
Yoskowitz, J. T.; Krafft, G. A.; Palacios-Serrano, G.; Wijethunga, S.; Grames, J.; Hansknecht, J.; Hernandez-Garcia, C.; Poelker, M.; Stutzman, M.; Suleiman, R.; and van der Geer, S. B., "Improving the Operational Lifetime of the CEBAF Photo-Gun by Anode Biasing" (2021). Physics Faculty Publications. 921.
https://digitalcommons.odu.edu/physics_fac_pubs/921