Document Type

Article

Publication Date

2003

Publication Title

New Diamond and Frontier Carbon Technology

Volume

13

Issue

6

Pages

341-351

Abstract

Diamond thin films grown by the microwave plasma enhances chemical vapor deposition (CVD) process have been investigated as an internal reference in fiber optic remote Raman sensing. The growth parameters have been optimized for diamond thin films on quarts substrates using a gas mixture of methane, carbon dioxide, and hydrogen. The resulting films exhibit essentially no Raman spectral background while exhibiting a strong Raman peak at 1332 cm-¹. The films are used as an internal reference in the quantitative measurement of chemical concentration using remote fiber optic Raman sensing. Internal referencing is accomplished by normalizing all spectral intensities of the chemical species to the integrated area of the CVD diamond reference peak at 1332 cm-¹ and verified using ethanol/water solutions. It is shown that the measurement is independent of laser power fluctuations.

Comments

Included with the kind permission of the MYU K.K with the assistance of the Nippon Institute of Technology.

© MYU K.K.

New Diamond and Frontier Carbon Technology

1-23-3-303 Sendagi, Bunkyo-ku, Tokyo 113-0022 Japan

Original Publication Citation

Albin, S., Zheng, J., Xiao, B., Cooper, J. B., Jeffers, R. B., & Antony, S. (2003). Chemical vapor deposited diamond films for self-referencing fiber optic Raman probes. New Diamond and Frontier Carbon Technology, 13(6), 341-351.

Download

Share

COinS