Document Type

Article

Publication Date

1996

DOI

10.1063/1.361506

Publication Title

Journal of Applied Physics

Volume

79

Issue

9

Pages

6853-6857

Abstract

Measurement of the surface mean-square atomic vibrational amplitude, or equivalently the surface Debye temperature, with reflection high-energy electron diffraction is discussed. Low-index surfaces of lead are used as examples. Particular details are given about the temperature-dependent diffraction pattern of Pb(100) in the Debye-Waller region. The use of reflection high-energy electron diffraction for measurement of the substrate surface temperature in thin-film deposition chambers is suggested. © 1996 American Institute of Physics.

Original Publication Citation

Elsayed-Ali, H. E. (1996). Surface Debye temperature measurement with reflection high-energy electron diffraction. Journal of Applied Physics, 79(9), 6853-6857. doi:10.1063/1.361506

Share

COinS